Hioki-3506-10 C METER
Dual-band 1kHz/1MHz Capacitance Meter for High Speed Testing of Ceramic Capacitors on Production Lines
Key Features and Functions
- High-speed analog test time of 0.6 ms (at 1 MHz)
- Improved noise resistance and enhanced repeatability in measurement precision even for production lines
- 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
- BIN function, for easy component screening
Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The 3506-10 is a dual-band capacitance meter designed to be integrated with automatic taping machines and sorters for production of MLCC (multi-layer ceramic capacitors).
Basic specifications
- Measurement parameters: C (Capacitance), D (loss coefficient, tan δ), Q (1/tan δ)
- Measurement range: C: 0.001 fF to 15.0000 μF, D: 0.00001 to 1.99999, Q: 0.0 to 19999.9
- Basic accuracy: (Typ.) C: ±0.14 % rdg., D: ±0.0013
- Measurement frequency: 1 kHz, 1 MHz
- Measurement signal level: 500 mV, 1 V rms
- Output impedance: 1 Ω (at 1 kHz in 2.2 μF and higher ranges), 20 Ω (in ranges other than the above)
- Display: LED (six digits, full scale count depends on measurement range)
- Measurement time: 1.5 ms: 1 MHz, 2.0 ms: 1 kHz (Typ. value. Depends on measurement configuration settings)
- Functions:
- BIN (measurement values can be classified by rank), Trigger-synchronous output, Setting configurations can be stored, Comparator, Averaging, Low-C reject (bad contact detection), Chatter detection, Current detection circuit monitoring, Applied voltage value monitoring
- EXT. I/O, RS-232C, GP-IB
Description
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Description
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Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The 3506-10 is a dual-band capacitance meter designed to be integrated with automatic taping machines and sorters for production of MLCC (multi-layer ceramic capacitors).
Basic specifications
- Measurement parameters: C (Capacitance), D (loss coefficient, tan δ), Q (1/tan δ)
- Measurement range: C: 0.001 fF to 15.0000 μF, D: 0.00001 to 1.99999, Q: 0.0 to 19999.9
- Basic accuracy: (Typ.) C: ±0.14 % rdg., D: ±0.0013
- Measurement frequency: 1 kHz, 1 MHz
- Measurement signal level: 500 mV, 1 V rms
- Output impedance: 1 Ω (at 1 kHz in 2.2 μF and higher ranges), 20 Ω (in ranges other than the above)
- Display: LED (six digits, full scale count depends on measurement range)
- Measurement time: 1.5 ms: 1 MHz, 2.0 ms: 1 kHz (Typ. value. Depends on measurement configuration settings)
- Functions:
- BIN (measurement values can be classified by rank), Trigger-synchronous output, Setting configurations can be stored, Comparator, Averaging, Low-C reject (bad contact detection), Chatter detection, Current detection circuit monitoring, Applied voltage value monitoring
- EXT. I/O, RS-232C, GP-IB
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