Hioki-IM7581-01 IMPEDANCE ANALYZER, 100 kHz to 300 MHz
100kHz to 300MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed
Key Features and Functions
- 100 kHz to 300 MHz testing source frequency
- Fastest test speed of 0.5 msec (Analog measurement time)
- ±0.72% rdg. basic accuracy
- Half-rack size body and palm-sized test head
- Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
- Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode
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Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7581 offers a top measurement time of 0.5ms over a 100kHz to 300MHz frequency range, making it ideal for high volume production of ferrite chip beads and chip inductors.
Key Specifications:
- Measurement modes: LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode
- Measurement parameters: Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q
- Measurable range: 100 mΩ to 5 kΩ
- Display range:
- Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ)
- Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99)
- θ: ± (0.000° to 180.000°), Cs, Cp: ± (0.00000 p to 9.99999 GF)
- D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS)
- G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %)
- Basic accuracy: Z: ±0.72 % rdg. θ: ±0.41°
- Measurement frequency: 100.00 kHz to 300.00 MHz (5 digits resolution)
- Measurement signal level:
- Power: -40.0 dBm to +7.0 dBm
- Voltage: 4 mV to 1001 mVrms
- Current: 0.09 mA to 20.02 mArms
- User-configured power, voltage, and current
- Output impedance: 50 Ω
- Display: 8.4-inch color TFT with touch screen
- Measurement speeds *1:
- FAST: 0.5 ms / MED: 0.9 ms / SLOW: 2.1 ms / SLOW2: 3.7 ms
*1 Analog measurement time - Functions: Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation
- Interfaces: Handler, USB, LAN, GP-IB (optional), RS-232C (optional)
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Description
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Query on the Item
Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7581 offers a top measurement time of 0.5ms over a 100kHz to 300MHz frequency range, making it ideal for high volume production of ferrite chip beads and chip inductors.
Key Specifications:
- Measurement modes: LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode
- Measurement parameters: Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q
- Measurable range: 100 mΩ to 5 kΩ
- Display range:
- Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ)
- Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99)
- θ: ± (0.000° to 180.000°), Cs, Cp: ± (0.00000 p to 9.99999 GF)
- D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS)
- G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %)
- Basic accuracy: Z: ±0.72 % rdg. θ: ±0.41°
- Measurement frequency: 100.00 kHz to 300.00 MHz (5 digits resolution)
- Measurement signal level:
- Power: -40.0 dBm to +7.0 dBm
- Voltage: 4 mV to 1001 mVrms
- Current: 0.09 mA to 20.02 mArms
- User-configured power, voltage, and current
- Output impedance: 50 Ω
- Display: 8.4-inch color TFT with touch screen
- Measurement speeds *1:
- FAST: 0.5 ms / MED: 0.9 ms / SLOW: 2.1 ms / SLOW2: 3.7 ms
*1 Analog measurement time - Functions: Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation
- Interfaces: Handler, USB, LAN, GP-IB (optional), RS-232C (optional)
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