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ITECH IT-M3124 Ultra-compact Wide Range DC Power Supply (850W, 300V, 6A)

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DC Output and Load Ratings:

  • Maximum 850 W
  • Maximum Output voltage: 0-300 V
  • Current: 0-6 A

DC Output Modes:

  • CV, CC, Battery Charging, LiST mode

Feature set:

  • 1U Half-Rack, Ultra-Compact Size
  • Adjustable rising/falling speed of output current
  • High speed test, up to 10 times per second
  • Up to 100 steps LIST operation, support output of various dynamic waveforms
  • Support CC/CV loop speed and priority setting
  • Parallel or series operation can be easily controlled by one unit
  • Independent control of multi- channels, one communication card can control up to 16 channels, max.256 channels
  • Support output of different timings of each channel, can synchronize or delay the output, and supports the output of different ratios of voltage
  • Support TRACE function, can draw voltage and current waveforms in real time ( Supported by PC software)
  • Battery charging test function
  • Software watchdog provides more reliable and safe automatic battery test solution
  • Various protection functions such as OVP, ±OCP, ±OPP, OTP, ensure secure testing
  • Provide self-locking function. When the device is locked, the device will not output voltage

Connectivity:

  • Support CANOPEN, LXI, SCPI and other communication protocols
  • Five optional cards for plug-and-play function, providing RS232, CAN, LAN, GPIB, USB_TMC, USB_VCP, RS485
  • External analog and IO communication interfaces

Product Number:

IT-M3124

Manufacturer:

ITECH

Quantity:

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The ITECH IT-M3100 series is not only innovative in terms of product technology, but also from the perspective of industry application to provide complete innovative solutions. Breaking through the traditional tech limits, in the ultra compact size of only 1U Half-Rack, the unit can not only output high power, but also has high performance and versatility.

It supports master-slave parallel mode. The full range of models support multiple stacking and parallel connection by handily designing 'leg' plug-in.Fit with rack mount kit to achieve the perfect use. This new series will empower the engineers with innovation and implement test technology advancements more quickly and more accurately.

The IT-M3100 series consists of 12 models, providing 6 voltages grades, and can be combined to achieve a variety of output power. It has a flexible modular architecture, independent multi-channel design, and supports synchronous operation. Users can configure each channel according to the test requirements of DUT, up to max. 16*16 channels, to meet the needs of customized solutions. It has a wide range of application values and is suitable for a variety of applications such as research and development, design verification and automatic test systems intergration.

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Description
Reviews
Query on the Item?

The ITECH IT-M3100 series is not only innovative in terms of product technology, but also from the perspective of industry application to provide complete innovative solutions. Breaking through the traditional tech limits, in the ultra compact size of only 1U Half-Rack, the unit can not only output high power, but also has high performance and versatility.

It supports master-slave parallel mode. The full range of models support multiple stacking and parallel connection by handily designing 'leg' plug-in.Fit with rack mount kit to achieve the perfect use. This new series will empower the engineers with innovation and implement test technology advancements more quickly and more accurately.

The IT-M3100 series consists of 12 models, providing 6 voltages grades, and can be combined to achieve a variety of output power. It has a flexible modular architecture, independent multi-channel design, and supports synchronous operation. Users can configure each channel according to the test requirements of DUT, up to max. 16*16 channels, to meet the needs of customized solutions. It has a wide range of application values and is suitable for a variety of applications such as research and development, design verification and automatic test systems intergration.

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