Hioki-3504-40 C HiTESTER
Dual-band 120Hz/1kHz Capacitance Meter for High Speed Inspection of Multi-Layer Ceramic Capacitors (MLCC) on Taping Machines
Key Features and Functions
- High speed measurement of 2ms
- Supports C measurements with voltage dependency characteristics through the use of constant voltage testing (CV)
- Model 3504-60 can detect contact failure on all 4 terminals for increased reliability
- BIN function on the 3504-60/-50 is ideal for sorting machines
- Model 3504-40 offers high speed and affordability, perfect for integrating into taping machines
- In all models, contact error is constantly monitored during measurement, contributing to increased yield
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Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The 3504 series are dual-band capacitance meters suited for large-capacitance MLCC inspections using a constant voltage.
Basic specifications
- Measurement parameters: C (capacitance), D (loss coefficient tan δ)
- Measurement range: C: 0.9400 pF to 20.0000 mF, D: 0.00001 to 1.99999
- Basic accuracy: (Typ.) C: ±0.09 % rdg. ±10 dgt., D: ±0.0016
- Measurement frequency: 120 Hz, 1 kHz
- Measurement signal level:
- 100 mV (3504-60 only), 500 mV, 1 V rms
- CV 100 mV Measurement range: up to 170 μF range (Source frequency 1 kHz), up to 1.45 mF range (Source frequency 120 Hz)
- CV 500 mV Measurement range : up to 170 μF range (Source frequency 1 kHz), up to 1.45 mF range (Source frequency 120 Hz)
- CV 1V Measurement range : up to 70 μF range (Source frequency 1 kHz), up to 700 μF range (Source frequency 120 Hz)
- Output impedance: 5Ω (In open terminal voltage mode outside of the CV measurement range)
- Display: LED (six digits, full scale count depends on measurement range)
- Measurement time: 2 ms (Typ. value. Depends on measurement configuration settings)
- Functions:
- 4-terminal contact check function (3504-60 only)
- BIN (measurement values can be classified by rank) (3504-50, 3504-60), Trigger-synchronous output, Setting configurations can be stored, Comparator, Averaging, Low-C reject (bad contact detection), Chatter detection
- EXT. I/O: RS-232C, GP-IB (3504-50, 3504-60)
Description
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Description
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Query on the Item
Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The 3504 series are dual-band capacitance meters suited for large-capacitance MLCC inspections using a constant voltage.
Basic specifications
- Measurement parameters: C (capacitance), D (loss coefficient tan δ)
- Measurement range: C: 0.9400 pF to 20.0000 mF, D: 0.00001 to 1.99999
- Basic accuracy: (Typ.) C: ±0.09 % rdg. ±10 dgt., D: ±0.0016
- Measurement frequency: 120 Hz, 1 kHz
- Measurement signal level:
- 100 mV (3504-60 only), 500 mV, 1 V rms
- CV 100 mV Measurement range: up to 170 μF range (Source frequency 1 kHz), up to 1.45 mF range (Source frequency 120 Hz)
- CV 500 mV Measurement range : up to 170 μF range (Source frequency 1 kHz), up to 1.45 mF range (Source frequency 120 Hz)
- CV 1V Measurement range : up to 70 μF range (Source frequency 1 kHz), up to 700 μF range (Source frequency 120 Hz)
- Output impedance: 5Ω (In open terminal voltage mode outside of the CV measurement range)
- Display: LED (six digits, full scale count depends on measurement range)
- Measurement time: 2 ms (Typ. value. Depends on measurement configuration settings)
- Functions:
- 4-terminal contact check function (3504-60 only)
- BIN (measurement values can be classified by rank) (3504-50, 3504-60), Trigger-synchronous output, Setting configurations can be stored, Comparator, Averaging, Low-C reject (bad contact detection), Chatter detection
- EXT. I/O: RS-232C, GP-IB (3504-50, 3504-60)
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