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Hioki-3274 CLAMP ON PROBE, DC to 10MHz), 150 Arms maximum

Wideband Current Probe for Oscilloscopes

Key Features and Functions

  • Waveform observation across a wide band from DC to MHz
  • Connects directly to oscilloscope or Memory HiCorder BNC input terminal

Product Number:

Hioki-3274

Manufacturer:

Hioki

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Hioki flat bandwidth current probes are best-in-class current sensors for use with Memory HiCorders and high performance oscilloscopes. The 3274 supports wide DC to 10 MHz bandwidth signals and 150A of continuous high input, letting you capture transient current signals from switching power supplies, inverters, and motor controllers.

The probe is designed with a high permeability magnetic shield to reduce the effects of electric fields, making it ideal for measuring low currents or nearby high-current lines.

Basic specifications

  • Frequency bandwidth: DC to 10 MHz (-3 dB)
  • Rise time: 35 ns or shorter
  • Noise level: 25 mA rms max. (bandwidth limited to 20 MHz)
  • Continuous allowable input: 150 A rms (requires derating at frequency)
  • Max. allowable peak input: 300 A peak (non continuous)
  • 500 A peak (pulse width: 30 μs or shorter)
  • Amplitude accuracy (30 min. after power-on, after degaussing and zero-adjustment):
    • ±1.0 % rdg. ±1 mV f.s. (DC, 45 to 66 Hz, 0 to 150 A rms)
    • ±2.0 % rdg. (DC, 45 to 66 Hz, 150 A to 300 A peak)
  • Output rate: 0.01 V/A (The output of this probe is internally terminated, so connect to voltage input equipment with high input impedance such as 1MΩ)
  • Measurable conductors: Insulated conductor
  • Core diameter: φ 20 mm (0.79 in)
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Description
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Hioki flat bandwidth current probes are best-in-class current sensors for use with Memory HiCorders and high performance oscilloscopes. The 3274 supports wide DC to 10 MHz bandwidth signals and 150A of continuous high input, letting you capture transient current signals from switching power supplies, inverters, and motor controllers.

The probe is designed with a high permeability magnetic shield to reduce the effects of electric fields, making it ideal for measuring low currents or nearby high-current lines.

Basic specifications

  • Frequency bandwidth: DC to 10 MHz (-3 dB)
  • Rise time: 35 ns or shorter
  • Noise level: 25 mA rms max. (bandwidth limited to 20 MHz)
  • Continuous allowable input: 150 A rms (requires derating at frequency)
  • Max. allowable peak input: 300 A peak (non continuous)
  • 500 A peak (pulse width: 30 μs or shorter)
  • Amplitude accuracy (30 min. after power-on, after degaussing and zero-adjustment):
    • ±1.0 % rdg. ±1 mV f.s. (DC, 45 to 66 Hz, 0 to 150 A rms)
    • ±2.0 % rdg. (DC, 45 to 66 Hz, 150 A to 300 A peak)
  • Output rate: 0.01 V/A (The output of this probe is internally terminated, so connect to voltage input equipment with high input impedance such as 1MΩ)
  • Measurable conductors: Insulated conductor
  • Core diameter: φ 20 mm (0.79 in)
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