Keysight S960904B Spectrum analysis for E5081A up to 20 GHz
Key Features
Achieve high-performance spectrum analysis up to 22 GHz
- Achieve high-performance spectrum analysis up to 44 GHz on E5081A ENA-X.
- Conduct fast spurious searches.
- Use multi-channel signal analysis with internal swept-signal generators.
- Make in-fixture spectrum measurements using VNA calibration.
- Execute fast and accurate band- / noise-power and NPR measurements.
Additional Documents:
The Keysight S960904B spectrum analyzer (SA) software application adds high-performance microwave spectrum analysis capabilities to the Keysight ENA-X up to 22 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Conduct simultaneous spectrum measurements using test and reference receivers. For efficient measurements of spurious signals emanating from mixers and frequency converters, combine the multi-channel SA with the internal swept-signal generators. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
The SA application adds NPR measurement to the ENA-X. It provides integrated measurement setup including multitone signal generation with vector signal generator. New coherent-measurement and vector-averaging techniques employed in the ENA-X SA application allow you to make faster and more accurate NPR and ACPR measurements with better dynamic range than the conventional NPR measurement with spectrum analyzer.
The Keysight S960904B spectrum analyzer (SA) software application adds high-performance microwave spectrum analysis capabilities to the Keysight ENA-X up to 22 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Conduct simultaneous spectrum measurements using test and reference receivers. For efficient measurements of spurious signals emanating from mixers and frequency converters, combine the multi-channel SA with the internal swept-signal generators. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
The SA application adds NPR measurement to the ENA-X. It provides integrated measurement setup including multitone signal generation with vector signal generator. New coherent-measurement and vector-averaging techniques employed in the ENA-X SA application allow you to make faster and more accurate NPR and ACPR measurements with better dynamic range than the conventional NPR measurement with spectrum analyzer.