Hioki-RM3542C-1 Hioki Resistance meter. Range 100 nΩ to 100 mΩ. With 16 ranges. RS-232 and External IO
High-precision resistance meter for automated in-line testing of chip resistors and ferrite beads
Key Features and Functions
- ΔR Function (process comparison) RM3542C-3 only
- BIN grading (sorting) RM3542C-3 only
- Jumper Resistance Measurement Support
- Takt time× repeatability
- Low-stress testing
- Noise immunity
Documents and Software:
The RM3542C is a DC resistance meter for automated in-line inspection of chip resistors and ferrite beads. On-instrument ΔR compares process-to-process change, while BIN grading (up to 7 bins) delivers instant pass/fail and ranking. Jumper-resistor assist speeds low-resistance screening. ≤5 V low-stress measurement and continuous contact monitoring secure reliability. Optimized ranges and a galvanic isolation architecture keep results stable on noisy lines, enabling stricter inspection with higher throughput.
Basic specifications
| Resistance range | [at Low Power OFF] 100 mΩ range (Max. 120.0000 mΩ, 0.1 μΩ* resolution) to 100 MΩ range (Max. 120.0000 MΩ, 100 Ω resolution), 16 steps *Additional range for RM3542C-3: 10 mΩ (Max. 12.00000 mΩ, 0.01 μΩ resolution) [at Low Power ON] 1000 mΩ range (Max. 1200.000 mΩ, 1 μΩ resolution) to 1000 Ω range (Max. 1200.000 Ω, 1 mΩ resolution), 6 steps | |||||
|---|---|---|---|---|---|---|
| Display | Monochrome graphic LCD 240 × 64 dot, white LED backlight | |||||
| Measurement accuracy | [with SLOW mode, at 100 mΩ range] ±0.015 % rdg. ±0.002 % f.s. [with SLOW mode, at 1000 Ω range] ±0.006 % rdg. ±0.001 % f.s. 90-day accuracy (RM3542C-3 only) [with SLOW mode, at 100 mΩ range] ±0.012 % rdg. ±0.002 % f.s. [with SLOW mode, at 1000 Ω range] ±0.005 % rdg. ±0.001 % f.s. | |||||
| Testing current | [at 100 mΩ range] 100 mA DC to [at 100 MΩ range] 100 nA DC | |||||
| Open-terminal voltage | 20 V DC max. (with applied voltage limit function enabled: max. 5 V DC) | |||||
| Sampling rate | FAST, MEDIUM, SLOW, 3 settings | |||||
| Measurement times | [at 100 Ω /300 Ω/1000 Ω ranges, with Low Power OFF] FAST: 0.9 ms, MED: 3.6 ms, SLOW: 17 ms (minimum time) | |||||
| Integration time | 0.1 ms to 100.0 ms, or 1 to 5 PLC at 50 Hz, 1 to 6 PLC at 60 Hz Note: PLC = one power line cycle (mains wave-form period) | |||||
| Other functions | Comparator (set-value vs. measured-value comparison), BIN Measurement (RM3542C-3), Low-power Resistance Measurement, Delay Setting, Offset Voltage Compensation (OVC), Integration Time Setting, Average (RM3542C-3), Faulty Measurement Detection, Probe Short-Circuit Detection, Contact Improvement, Current Mode Setting, Stage Mismatch Prevention, Scaling, Retry, Applied Voltage Limiter Function, Jumper Resistance Measurement Support, Preset, ΔR (RM3542C-3), Memory, Statistical Calculation, Settings Monitor, Trigger Source Setting, Printer Function | |||||
| Interfaces | RS-232C, Printer (RM-232C), GP-IB (Model RM3542C-2) | |||||
| External I/O | Trigger, Hold input, Comparator output and other, Settings monitor terminal | |||||
Description
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Description
Reviews
Query on the Item
The RM3542C is a DC resistance meter for automated in-line inspection of chip resistors and ferrite beads. On-instrument ΔR compares process-to-process change, while BIN grading (up to 7 bins) delivers instant pass/fail and ranking. Jumper-resistor assist speeds low-resistance screening. ≤5 V low-stress measurement and continuous contact monitoring secure reliability. Optimized ranges and a galvanic isolation architecture keep results stable on noisy lines, enabling stricter inspection with higher throughput.
Basic specifications
| Resistance range | [at Low Power OFF] 100 mΩ range (Max. 120.0000 mΩ, 0.1 μΩ* resolution) to 100 MΩ range (Max. 120.0000 MΩ, 100 Ω resolution), 16 steps *Additional range for RM3542C-3: 10 mΩ (Max. 12.00000 mΩ, 0.01 μΩ resolution) [at Low Power ON] 1000 mΩ range (Max. 1200.000 mΩ, 1 μΩ resolution) to 1000 Ω range (Max. 1200.000 Ω, 1 mΩ resolution), 6 steps | |||||
|---|---|---|---|---|---|---|
| Display | Monochrome graphic LCD 240 × 64 dot, white LED backlight | |||||
| Measurement accuracy | [with SLOW mode, at 100 mΩ range] ±0.015 % rdg. ±0.002 % f.s. [with SLOW mode, at 1000 Ω range] ±0.006 % rdg. ±0.001 % f.s. 90-day accuracy (RM3542C-3 only) [with SLOW mode, at 100 mΩ range] ±0.012 % rdg. ±0.002 % f.s. [with SLOW mode, at 1000 Ω range] ±0.005 % rdg. ±0.001 % f.s. | |||||
| Testing current | [at 100 mΩ range] 100 mA DC to [at 100 MΩ range] 100 nA DC | |||||
| Open-terminal voltage | 20 V DC max. (with applied voltage limit function enabled: max. 5 V DC) | |||||
| Sampling rate | FAST, MEDIUM, SLOW, 3 settings | |||||
| Measurement times | [at 100 Ω /300 Ω/1000 Ω ranges, with Low Power OFF] FAST: 0.9 ms, MED: 3.6 ms, SLOW: 17 ms (minimum time) | |||||
| Integration time | 0.1 ms to 100.0 ms, or 1 to 5 PLC at 50 Hz, 1 to 6 PLC at 60 Hz Note: PLC = one power line cycle (mains wave-form period) | |||||
| Other functions | Comparator (set-value vs. measured-value comparison), BIN Measurement (RM3542C-3), Low-power Resistance Measurement, Delay Setting, Offset Voltage Compensation (OVC), Integration Time Setting, Average (RM3542C-3), Faulty Measurement Detection, Probe Short-Circuit Detection, Contact Improvement, Current Mode Setting, Stage Mismatch Prevention, Scaling, Retry, Applied Voltage Limiter Function, Jumper Resistance Measurement Support, Preset, ΔR (RM3542C-3), Memory, Statistical Calculation, Settings Monitor, Trigger Source Setting, Printer Function | |||||
| Interfaces | RS-232C, Printer (RM-232C), GP-IB (Model RM3542C-2) | |||||
| External I/O | Trigger, Hold input, Comparator output and other, Settings monitor terminal | |||||
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